Ernst Bauer, Arizona State University
Hendrik Ohldag, Stanford Linear Accelerator Center
Frank Meyer zu Heringdorf, Universität Duisburg-Essen
Distinguished Guest Lecturers:
Grace Burke, University of Manchester
William Chueh, Stanford University
Hongjun Gao, Chinese Academy of Sciences
Shuji Hasegawa, University of Tokyo
Andreas Heinrich, IBM Almaden
Andrew Westphal, UC Berkeley
LEEM-PEEM is a biennial meeting reviewing the status of LEEM, PEEM, SPLEEM, XPEEM and related techniques. The meeting promotes and disseminates applications of cathode lens microscopy to a broad audience of interested scientists.
The workshop highlights the most recent scientific advances as well as instrumental developments. Topics will cover surfaces, thin films, organic films, surface chemistry, magnetism, time resolved methods, instrumental advances and novel applications of LEEM and PEEM to other subject areas.