LEEM/PEEM-10 is a biennial, international workshop of scientists using cathode lens microscopy techniques for the characterization and study of surfaces and thin films. The meeting also focuses on Instrumentation development in the areas of electron optics and electron detection, nano-manipulation, in-situ sample characterization and thin film growth.
Link to room layout
We are offering special sponsorship opportunities to interested vendors, which we hope should greatly increase the visibility of their presence at the conference and will support important features of the program. We also plan to host a student poster award competition, encouraging young scientists to attend.
Please contact email@example.com, if you are interested in attending the 10th LEEM/PEEM meeting as an exhibitor or if you have any questions about our sponsorship opportunities.
September 11-15, 2016
Portola Hotel & Spa
Two Portola Plaza
Monterey, CA 93940
Andreas SchmidConference office: