Synchrotron PEEM - A Look at Magnetism and Chemistry
at Surfaces and Interfaces on the Nanoscale
Hendrik Ohldag, Stanford Linear Accelerator Center
Modern
devices
rely on components based on complex materials like multilayers, oxides
or alloys that are fascinating to researchers and engineers alike.
To obtain a deeper understanding of the relevant science behind such
complex devices and to find ways to improve their performance it is
necessary to use an experimental approach that can distinguish between
the different components with nanometer spatial
and picosecond time resolution. It is also crucial to be able to
separate electric, magnetic, structural and chemical properties of the
device, since these are often closely related. It turns out that x-ray
microscopy using synchrotron radiation provides exactly
such capabilities. The pulsed nature of a synchrotron as x-ray source
also allows for studying the time dependent behavior of a sample. In
this talk I will give an introduction on how one
can use photoemission electron microscopy at a synchrotron and explain
how to use a synchrotron to answer a question that you may have about
your sample. |
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